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Manufacturability Signoff Community

 
Diagnosis of Compressed Test Patterns: Several Things to Consider
 By Thomas Jackson on October 21, 2008
Today, it is essential to put into place a strong methodology to identify sources of yield loss during manufacturing. One widely accepted method involves diagnosing a representative sample of device failures during manufacturing test. The failing results... Read more »
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Video interviews from the floor of CDNLive!
 By Tom Diederich on September 10, 2008
With hundreds of attendees buzzing about, our video crew has been busy with their “man-on-the-street” style interviews from the floor of “CDNLive! Silicon Valley 2008” here at the San Jose Convention Center. The “CDN”... Read more »
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What works best?
 By Thomas Jackson on August 14, 2008
Today's conventional wisdom tells us EDA folks the majority of yield loss at semiconductor companies is due to systematic issues, that's what my customers say to me. When I speak with new prospective users of my yield ramp solution, I normally... Read more »
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