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Manufacturability Signoff Community

 
What works best?
 By Thomas Jackson on August 14, 2008
Today's conventional wisdom tells us EDA folks the majority of yield loss at semiconductor companies is due to systematic issues, that's what my customers say to me. When I speak with new prospective users of my yield ramp solution, I normally... Read more »
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Please allow me to ...
 By Thomas Jackson on August 06, 2008
In the words of the Rolling Stones…. Please Allow Me to Introduce Myself ,,,,, I took a different slat than Chris on my intro but I am a Product Marketing Director for Cadence's Diagnostics and silicon analysis products. I also have over 20... Read more »
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Anyone involved in managing OPC or DFM may want to read this
 By Thomas Jackson on August 06, 2008
There is a good article in the August edition of Microlithography World that anyone involved in managing OPC or DFM may want to read. I may be a bit biased (I was one of the authors) but it is good...... Here's a link to the article . Fujitsu, Applied... Read more »
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